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  1. Modeling of Electrical Overstress in Integrated Circuits Modeling of Electrical Overstress in Integrated Circuits

    Modeling of Electrical Overstress in Integrated Circuits

    Carlos H. Diaz
    Springer US
    27.09.2012

    Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant threat...

    Taschenbuch
    160,49 €
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  2. Hot-Carrier Reliability of MOS VLSI Circuits Hot-Carrier Reliability of MOS VLSI Circuits

    Hot-Carrier Reliability of MOS VLSI Circuits

    Sung-Mo (Steve) Kang
    Springer US
    27.09.2012

    As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

    Taschenbuch
    213,99 €
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  3. Electrothermal Analysis of VLSI Systems Electrothermal Analysis of VLSI Systems

    Electrothermal Analysis of VLSI Systems

    Yi-Kan Cheng
    Springer US
    20.04.2013

    Electrothermal Analysis of VLSI Systems addresseselectrothermal problems in modern VLSI systems. ...

    Taschenbuch
    106,99 €
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  4. Design Automation for Timing-Driven Layout Synthesis Design Automation for Timing-Driven Layout Synthesis

    Design Automation for Timing-Driven Layout Synthesis

    Sung-Mo (Steve) Kang
    Springer US, Springer US
    31.10.1992

    Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be do...

    Gebunden
    160,49 €
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  5. Physical Design for Multichip Modules Physical Design for Multichip Modules

    Physical Design for Multichip Modules

    Sung-Mo (Steve) Kang
    Springer US, Springer US
    31.03.1994

    Physical Design for Multichip Modules collects togethera large body of important research work th...

    Gebunden
    160,49 €
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  6. Electrothermal Analysis of VLSI Systems Electrothermal Analysis of VLSI Systems

    Electrothermal Analysis of VLSI Systems

    Yi-Kan Cheng
    Springer US, Springer US
    30.06.2000

    Electrothermal Analysis of VLSI Systems addresseselectrothermal problems in modern VLSI systems. ...

    Gebunden
    106,99 €
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    Alle Preise inkl. MwSt | Versandkostenfrei
  7. Hot-Carrier Reliability of MOS VLSI Circuits Hot-Carrier Reliability of MOS VLSI Circuits

    Hot-Carrier Reliability of MOS VLSI Circuits

    Sung-Mo (Steve) Kang
    Springer US, Springer US
    30.06.1993

    As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

    Gebunden
    213,99 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  8. Modeling of Electrical Overstress in Integrated Circuits Modeling of Electrical Overstress in Integrated Circuits

    Modeling of Electrical Overstress in Integrated Circuits

    Carlos H. Diaz
    Springer US, Springer US
    30.11.1994

    Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant threat...

    Gebunden
    160,49 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  9. Design Automation for Timing-Driven Layout Synthesis Design Automation for Timing-Driven Layout Synthesis

    Design Automation for Timing-Driven Layout Synthesis

    Sung-Mo (Steve) Kang
    Springer US
    04.10.2012

    Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be do...

    Taschenbuch
    160,49 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  10. Physical Design for Multichip Modules Physical Design for Multichip Modules

    Physical Design for Multichip Modules

    Sung-Mo (Steve) Kang
    Springer US
    08.10.2012

    Physical Design for Multichip Modules collects togethera large body of important research work th...

    Taschenbuch
    160,49 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
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