The fast-developing information technology industry is driving a need for new materials in order ...
Keine ausführliche Beschreibung für 'Bondkontakte' verfügbar.
Finding new materials for copper low-k interconnects is critical to the continuing development of...
The conference was on reliability related science in ULSI interconnect. Its main purpose was to d...
One current challenge to micro- and nanoelectronics is the understanding of stress-related phenom...
Unser bisheriger Preis:ORGPRICE: 153,50 €
Scientist and engineers as well as graduate students in the fields of This conference will be of ...
Unser bisheriger Preis:ORGPRICE: 139,50 €
Stress-induced voiding and electromigration have emerged to become key reliability problems for s...
Unser bisheriger Preis:ORGPRICE: 124,50 €
The fast-developing information technology industry is driving a need for new materials in order ...
Unser bisheriger Preis:ORGPRICE: 213,99 €
These proceedings present current research on issues related to stress-induced phenomena in on-ch...